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SC4045: Control for High Resolution Imaging
Responsible Instructor: M.H.G. Verhaegen
Contact Hours / Week x/x/x/x: 0/0/0/4
Education Period: 4
Start Education: 4
Exam Period: 4, 5
Course Language: English
Course Contents: High resolution imaging is crucial in scientific breakthroughs, such as discovering new earth-like planets in other galaxies than our solar system, or discovering the origin and progress of diseases at a molecular level. For that purpose special optical instruments like Extreme Large Telescopes or STED microscopy are developed. There is one key obstacle that hampers a clear vision and inviting control engineers to step in. These are the disturbances induced by the medium, like turbulence in case of astronomy or by the specimen under investigation, like the change in diffraction index due to inhomogeneities in the biological tissue. This fascinating and expanding field in science is providing an excellent challenge to control engineers to help rejecting the disturbances by active control. This course will review the hardware necessary to control light waves in modern optical instruments, their modeling from a control engineering perspective and discuss model based control methodologies to do disturbance rejection.
Study Goals: Understand the propagation of light, imaging and aberrations in the imaging process. Understand the operation principle of pupil plane and focal plane sensors to estimate the wavefront aberrations. Understand the design principles of opto-mechatronic wavefront corrector devices to correct the wavefront aberrations. Develop spatial and temporal models of complete imaging systems and use these models in the design of model based controllers for aberration correction.
Education Method: Oral presentations
Literature and Study Materials: Course Notes
Assessment: Practical Assignment
Last modified: 6 November 2013, 15:24 UTC
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