||Scanning transmission electron microscopes (STEMs) are the tools of choice for nanotechnology research, since they are capable of producing images with magnifications in excess of 1 million and verifiable measurements in the range of a few Angstroms. There is currently a strong industrial push for automating STEMs.
Such automation requires to control a number of parameters, such as defocus range, optical aberration strength, or sample positioning, which can only be measured from images. The image formation process in a STEM microscope can be considered a linear system over space, whose transfer function varies over time. Moreover, under very simplified conditions, this behavior can be modeled by a PDE.
Thus, the goal of this master thesis project is to develop a Simulink-based simulation environment for the image formation process of a TEM microscope using as a starting point the current PDE simulation tools. This simulator will then be used to test different control strategies for the microscope