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List of publications - dr.ir. A.J. den Dekker

 

 

Authored or co-authored journal papers

  • D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos (2003)
    Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
    Ultramicroscopy 98: (1), p.27-42
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  • S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
    High-resolution electron microscopy and electron tomography: resolution versus precision
    Journal of Structural Biology, Academic Press, San Diego, 2002 138: (), p.21-33
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2002)
    High-Resolution Electron Microscopy: From Imaging Toward Measuring
    IEEE Transactions on Instrumentation and Measurement 51: (4), p.611-615
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  • S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
    Optimal experimental design of STEM measurement of atom column positions
    Ultramicroscopy 90: (4), p.273-289
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  • A.J. den Dekker, S. Van Aert, D. Van Dyck, A. van den Bos, P. Geuens (2001)
    Does a monochromator improve the precision in quantitative HRTEM?
    Ultramicroscopy 89: (4), p.275-290
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
    High resolution electron microscopy: from imaging towards measuring
    Selected Topics in Signals, Systems and Control, Edited by O.H. Bosgra, P.M.J. Van den Hof and C.W. Scherer, Delft University Press, Delft, The Netherlands, 2001 12, p.89-96, ISBN:90-407-2246-3
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  • E. Bettens, A.J. den Dekker, J. Sijbers, A. van den Bos, D. Van Dyck (1999)
    Model-based two-object resolution from observations having counting statistics
    Ultramicroscopy 77, p.37-48
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  • E. Bettens, A.J. den Dekker, J. Jansen, M. Op de Beeck, J. Sijbers, A. van den Bos, D. Van Dyck, H. Zandbergen (1999)
    Towards quantitative structure determination through electron holographic methods
    Materials Characterization 42: (4-5), p.265-281
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  • A.J. den Dekker, J. Sijbers, D. Van Dyck (1999)
    How to optimize the design of a quantitative HREM experiment so as to attain the highest precision
    Journal of Microscopy 194: (1), p.95-104
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  • J. Sijbers, A.J. den Dekker, A. Van der Linden, D. Van Dyck, M. Verhoye (1999)
    Adaptive anisotropic noise filtering for magnitude MR data
    Magnetic Resonance Imaging 17: (10), p.1533-1539
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  • J. Sijbers, A.J. den Dekker, E. Raman, D. Van Dyck (1999)
    Parameter estimation from magnitude MR images
    International Journal of Imaging Systems and Technology 10: (2), p.109-114
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  • J. Sijbers, A.J. den Dekker, J. Van Audekerke, M. Verhoye (1998)
    Estimation of the noise in magnitude MR images
    Magnetic Resonance Imaging 16: (1), p.87-90
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  • J. Sijbers, A.J. den Dekker, P. Scheunders, D. Van Dyck (1998)
    Maximum Likelihood estimation of Rician Distribution Parameters
    IEEE Transactions on Medical Imaging 17: (3), p.357-361
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  • A.J. den Dekker (1997)
    Model-based Optical Resolution
    IEEE Transactions on Instrumentation and Measurement 46: (4), p.798-802
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  • A.J. den Dekker (1997)
    On Two-Point resolution of imaging systems
    Periodica Polytechnica Series Electrical Engineering 41: (3), p.167-183

  • A.J. den Dekker, A. van den Bos (1997)
    Resolution: a survey
    Journal of the Optical Society of America A 14: (3), p.547-557
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  • D. Van Dyck, E. Bettens, J. Sijbers, M. Op de Beeck, A. van den Bos, A.J. den Dekker (1997)
    From high resolution image to atomic structure: how far are we?
    Scanning Microscopy : (11), p.467-478
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  • A. van den Bos, A.J. den Dekker (1996)
    Coherent model-based optical resolution
    Journal of the Optical Society of America A 13: (8), p.1667-1669
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  • A. van den Bos, A.J. den Dekker (1995)
    Ultimate resolution in the presence of coherence
    Ultramicroscopy 60, p.345-348
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Contributions to books

  • A. van den Bos, A.J. den Dekker (2001)
    Resolution Reconsidered - Conventional Approaches and an Alternative
    P.W. Hawkes (ed.), Advances in Imaging and Electron Physics, Volume 117, Academic Press, San Diego, p.242-360

  • D. Van Dyck, E. Bettens, A.J. den Dekker, J. Jansen, M. Op de Beeck, J. Sijbers, A. van den Bos, H. Zandbergen (1997)
    Resolving atoms: what do we have?, what do we want?
    Institute of Physics Conference Series number 153, Section 3, Edited by J.M. Rodenburg, Institute of Physics Ltd, Bristol, 1997, p.95-100
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Authored or co-authored conference papers

  • A.J. den Dekker, S. Van Aert (2002)
    Quantitative high resolution electron microscopy and Fisher information
    Proceedings of the 15th International Congress on Electron Microscopy, Edited by R. Cross, Microscopy Society of Southern Africa, Onderstepoort, South Africa, 2002, Durban, South Africa, 1-6 September 2002, Volume:3, p.185-186, ISBN:0-620-29294-6
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  • J.W. Lankhaar, A. Vonk Noordegraaf, J.T. Marcus, A.J. den Dekker, Th.J.C. Faes, R.M. Heethaar, N. Westerhof, P.E. Postmus (2002)
    Estimating parameters of the pulmonary circulation from pressure and flow measurements in pulmonary hypertension
    Proceedings of the 2nd European Medical and Biological Engineering Conference (EMBEC'02), Edited by H. Hutten, P.Krösl, Vienna, Austria, 4-8 Dec 2002, p.1246-1247

  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2002)
    The benefits of statistical experimental design for quantitative electron microscopy
    Proceedings of the 15th International Congress on Electron Microscopy, Edited by R. Cross, Microscopy Society of Southern Africa, Onderstepoort, South Africa, 2002, Durban , South Africa, 1-6 September 2002, Volume:3, p.189-190, ISBN:0-620-29294-6
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  • D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos (2002)
    How to select the items for the shopping list of future high resolution electron microscopists?
    Microscopy and Microanalysis 8, Suppl. 2: Proceedings Microscopy and Microanalysis 2002, Edited by E. Voelkl, D. Piston, R. Gauvin, A.J. Lockley, G.W. Bailey and S. McKernan, Cambridge University Press, Cambridge, 2002, Québec, Canada, 4-8 August 2002, Volume:8, p.94-95
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
    High Resolution Electron Microscopy: From Imaging Towards Measuring
    Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference, IEEE, Piscataway, NJ, 2001, Budapest, May 21-23, 2001, Volume:3, p.2081-2086
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  • A.J. den Dekker, S. Van Aert, A. van den Bos, D. Van Dyck (2000)
    A quantitative evaluation of different STEM imaging modes
    Proceedings of EUREM 12, the 12th European Congress on Electron Microscopy, Edited by L. Frank and F. Ciampor, Czechoslovak Society for Electron Microscopy, Brno, 2000, Brno, Czech Republic, July 9-14 , 2000, p.I 131-I 132
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  • A.J. den Dekker, P. Geuens, S. Van Aert, A. van den Bos, D. Van Dyck (2000)
    Does a monochromator improve the precision in quantitative HRTEM?
    Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the joint Meeting of the BVM and the NVvM, Edited by H.K. Koerten, NVvM, 2000, Papendal, Arnhem, The Netherlands, December 7-8, 2000, p.138-140, ISBN:1389-5362

  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2000)
    Design aspects for an optimum DF STEM probe
    Proceedings of EUREM 12, the 12th European Congress on Electron Microscopy, Edited by L. Frank and F. Ciampor, Volume III, Instrumentation and Methodology. Edited by P. Tomanek and R. Kolarik., Czechoslovak Society for Electron Microscopy, Brno, 2000, p.I 129-I 130
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2000)
    Quantitative ADF STEM: guidelines towards an inmproved experimental design
    Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the joint Meeting of the BVM and the NVvM, Edited by H.K. Koerten, NVvM, 2000, Papendal, Arnhem, The Netherlands, December 7-8, 2000, p.126-127, ISBN:1389-5362

  • A.J. den Dekker, D. Van Dyck (1999)
    Quantitative HREM: viewpoints on resolution, precision and experimental design
    Acta Cryst. A55 Supplement, Abstract M11.OE.005

  • P. Geuens, J.H. Chen, A.J. den Dekker, D. Van Dyck (1999)
    An analytic expression in closed form for the electron exit wave
    Acta Cryst. A55 Supplement, Abstract P11.OE.002, Poster presented at the XVIII IUCR Congress in Glasgow, Scotland, August 4-13, 1999
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  • E. Bettens, A.J. den Dekker, J. Sijbers, D. Van Dyck (1998)
    Ultimate resolution in the framework of parameter estimation
    Proceedings of the IASTED International Conference on Signal and Image Processing (SIP '98), Las Vegas, Nevada, USA, October 28-31, 1998, p.229-233
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  • A.J. den Dekker, J. Sijbers, D. Van Dyck (1998)
    How to design an HREM experiment so as to attain the highest resolution?
    Abstracts of the 14th International Congress on Electron Microscopy, Symposium S, Volume I, Cancun, Mexico, Aug 31 - Sep 4, 1998, p.621-622

  • A.J. den Dekker, J. Sijbers, D. Van Dyck, M. Verhoye (1998)
    Maximum Likelihood estimation of the signal component magnitude in phase contrast MR images
    Medical Imaging 1998: Image Processing, Kenneth M. Hanson, editor, Proceedings SPIE Vol. 3338, p.408-415
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  • A.J. den Dekker, J. Sijbers, D. Van Dyck (1998)
    Optimizing the design of an HREM experiment so as to attain the highes resolution
    Abstracts of the 7th Conference on Frontiers of Electron Microscopy in Materials Science, Irsee, Germany, April 19-24, 1998

  • A.J. den Dekker, J. Sijbers, D. Van Dyck (1998)
    Optimizing the setting of an electron microscope so as to attain the highest resolution: an approach based on statistical parameter estimation theory
    Abstracts of the Port Ludlow workshop towards atomic resolution analysis (TARA '98), Olympic Peninsula, Washington State, USA, September 6-11, 1998

  • J. Sijbers, A.J. den Dekker, E. Raman, D. Van Dyck (1998)
    Estimation of signal and noise from Rician distributed data
    Proceedings of ICSPC 1998, the International Conference on Signal Processing and Communications, Anaheim, p.140-142
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  • J. Sijbers, A.J. den Dekker, E. Raman, D. Van Dyck, M. Verhoye (1998)
    Optimal estimation of T2 maps from magnitude MR images
    Medical Imaging 1998: Image Processing, Kenneth M. Hanson, editor, Proceedings SPIE Vol. 3338, p.408-415
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  • D. Van Dyck, E. Bettens, A.J. den Dekker, J. Sijbers (1998)
    Dose Limited Resolution
    Microscopy and Microanalysis 4, Suppl. 2: Proceedings Microscopy and Microanalysis '98, Atlanta, Georgia, U.S.A., July 12-16, 1998, p.802-803

  • J. Sijbers, A.J. den Dekker, E. Raman, P. Scheunders, D. Van Dyck (1997)
    Unbiased signal estimation in magnitude MR images Magnetic resonance materials in Physics, Biology and Medicine, Supplement to Volume V, Nr. II, June 1997
    Scientific program and book of abstracts of ESMRMB '97, the 14th Annual Meeting of the European Society for Magnetic Resonance in Medicine and Biology, p.174

  • A.J. den Dekker (1996)
    A study of model fitting in spectroscopy and chromatography
    Proceedings of ASCI '96, the 2nd annual conference of the Advanced School for Computing and Imaging, Lommel, Belgium, June 5-7, 1996, p.265-270

  • A.J. den Dekker (1996)
    Coherent model-based optical resolution and SNR
    Proceedings of EUSIPCO 1996, VIII European Signal Processing Conference, Triest, Italy, September 10-13, 1996, p.17-20
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  • A.J. den Dekker (1996)
    Model-based optical resolution
    Proceedings of IMTC\96, the joint conference: IEEE Instrumentation and Measurement Technology Conference - IMEKO TC-7, Brussels, Belgium, June 4-6, 1996, p.441-446

  • A.J. den Dekker (1996)
    Model-based optical two-point resolution
    Proceedings of ICASSP 1996, the IEEE International Conference on Acoustics, Speech and Signal Processing, Atlanta, USA, May 7-10, 1996, p.2395-2398
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  • A.J. den Dekker (1995)
    Model-based optical resolution
    Abstracts of the ASCI Imaging Workshop 1995, Venray, The Netherlands, October 25-27, 1995, p.20-21

  • A.J. den Dekker (1995)
    On Two-Point resolution of imaging systems: a parameter estimation approach
    Proceedings of ASCI '95, the first annual conference of the Advanced School for Computing and Imaging, Heijen, The Netherlands, May 16-18, 1995, p.323-332

  • A.J. den Dekker (1994)
    On Two-Point resolution in partially coherent light: a parameter estimation approach
    Proceedings of EUSIPCO 1994, VII European Signal Processing Conference, Edinburgh, Scotland, U.K., September 13-16, 1994, p.1421-1424

  • A.J. den Dekker (1994)
    On Two-Point resolution of imaging systems
    Abstract of the 5th Biennial Seminar on Intelligent Measuring Systems, Budapest, July 1-4, 1994, p.18

 

Abstracts

  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
    Electron tomography: resolution versus precision
    Academy Colloquium Electron Tomography, The Royal Netherlands Academy of Arts and Sciences (KNAW), Amsterdam, 2001, October 17-20, 2001

  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
    Experiment design in quantitative electron microscopy
    Abstracts "Dreilandertagung fur Elektronenmikroskopie" - A Conference on Modern Microscopical Methods, September 9-14, 2001, p.28

 

Ph.D.Thesis

  • A.J. den Dekker (1997)
    Model-based Resolution
    Delft University of Technology, Delft University Press, Delft, The Netherlands, 1997, p.158, ISBN:90-407-1548-3 / CIP. For a free copy, please contact a.j.dendekker@dcsc.tudelft.nl

Last modified: 23 February 2004, 12:20 UTC
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