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List of publications - prof.dr.ir. A. van den Bos

 

 

Authored or co-authored journal papers

  • D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos (2003)
    Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
    Ultramicroscopy 98: (1), p.27-42
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  • S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
    High-resolution electron microscopy and electron tomography: resolution versus precision
    Journal of Structural Biology, Academic Press, San Diego, 2002 138: (), p.21-33
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2002)
    High-Resolution Electron Microscopy: From Imaging Toward Measuring
    IEEE Transactions on Instrumentation and Measurement 51: (4), p.611-615
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  • S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
    Optimal experimental design of STEM measurement of atom column positions
    Ultramicroscopy 90: (4), p.273-289
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  • A.J. den Dekker, S. Van Aert, D. Van Dyck, A. van den Bos, P. Geuens (2001)
    Does a monochromator improve the precision in quantitative HRTEM?
    Ultramicroscopy 89: (4), p.275-290
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  • M.F.P. Tolsma, A. van den Bos, G. Blacquière (2001)
    Experimental design for geoacoustic parameter inversion
    Selected Topics in Signals, Systems and Control, Edited by O.H. Bosgra, P.M.J. Van den Hof and C.W. Scherer, Delft University Press, Delft, The Netherlands, 2001 12, p.97-103, ISBN:90-407-2246-3
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  • S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
    High resolution electron microscopy: from imaging towards measuring
    Selected Topics in Signals, Systems and Control, Edited by O.H. Bosgra, P.M.J. Van den Hof and C.W. Scherer, Delft University Press, Delft, The Netherlands, 2001 12, p.89-96, ISBN:90-407-2246-3
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  • J.C. Patra, A. van den Bos (2000)
    Auto-calibration and -compensation of a capacitive pressure sensor using multilayer perceptrons
    ISA Transactions 39, p.175-190

  • J.C. Patra, A. van den Bos (2000)
    Modeling of an intelligent pressure sensor using functional link artificial neural networks
    ISA Transactions 39: (1), p.15-27

  • A. van den Bos (2000)
    Aberration and the Strehl ratio
    Journal of the Optical Society of America A 17: (2), p.356-358

  • A. van den Bos (2000)
    Generalization of Bonnet's theorem
    Annals of telecommunications 55: (5-6), p.302-303

  • E. Bettens, A.J. den Dekker, J. Sijbers, A. van den Bos, D. Van Dyck (1999)
    Model-based two-object resolution from observations having counting statistics
    Ultramicroscopy 77, p.37-48
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  • E. Bettens, A.J. den Dekker, J. Jansen, M. Op de Beeck, J. Sijbers, A. van den Bos, D. Van Dyck, H. Zandbergen (1999)
    Towards quantitative structure determination through electron holographic methods
    Materials Characterization 42: (4-5), p.265-281
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  • J.C. Patra, A. van den Bos (1999)
    Modelling and development of an ANN-based smart pressure sensor in a dynamic environment
    IMEKO International Journal Measurement 26: (4), p.249-262

  • A. van den Bos (1999)
    Rayleigh wave-front criterion: comment
    Journal of the Optical Society of America A 16: (9), p.2307-2309

  • A. van den Bos (1998)
    The real-complex normal distribution
    IEEE Transactions on Information Theory 44, p.1670-1672

  • A.J. den Dekker, A. van den Bos (1997)
    Resolution: a survey
    Journal of the Optical Society of America A 14: (3), p.547-557
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  • A. van den Bos (1997)
    Complex electron wave reconstruction using parameter estimation
    IEEE Transactions on Instrumentation and Measurement 46, p.826-830

  • D. Van Dyck, E. Bettens, J. Sijbers, M. Op de Beeck, A. van den Bos, A.J. den Dekker (1997)
    From high resolution image to atomic structure: how far are we?
    Scanning Microscopy : (11), p.467-478
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  • A.H. Buist, M.A.O. Miedema, A. van den Bos (1996)
    Optimal experimental design for exit wave reconstruction from focal series in TEM
    Ultramicroscopy 64, p.137-152

  • A. van den Bos, A.J. den Dekker (1996)
    Coherent model-based optical resolution
    Journal of the Optical Society of America A 13: (8), p.1667-1669
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  • A. van den Bos (1996)
    Price's theorem for complex variates
    IEEE Transactions on Information Theory 42, p.286-287

  • A. van den Bos (1995)
    Estimation of complex Fourier coefficients
    IEE Proceedings on Control Theory and Applications 142, p.253-256

  • A. van den Bos (1995)
    The multivariate complex normal distribution - A generalization
    IEEE Transactions on Information Theory 41, p.537-539

  • A. van den Bos, A.J. den Dekker (1995)
    Ultimate resolution in the presence of coherence
    Ultramicroscopy 60, p.345-348
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  • M.A.O. Miedema, A.H. Buist, A. van den Bos (1994)
    Experimental design of exit wave reconstruction from a transmission electron microscope defocus series
    IEEE Transactions on Instrumentation and Measurement IM-43, p.181-186

  • A. van den Bos (1994)
    A Cramer-Rao lower bound for complex parameters
    IEEE Transactions on Signal Processing 42, p.2859

  • A. van den Bos (1994)
    Complex gradient and Hessian
    IEE Proceedings on Vision, Image and Signal Processing 141, p.380-382

  • A. van den Bos (1994)
    Parametric statistical model-based measurement
    Measurement 14, p.55-61

  • A. van den Bos (1993)
    Best linear unbiased estimation of the Fourier coefficients of periodic signals
    IEEE Transactions on Instrumentation and Measurement IM-42, p.49-50

  • A. van den Bos (1993)
    Critical errors associated with parameter resolvability
    Computer Physics Communications 76, p.184-190

  • A. van den Bos, J.H. Swarte (1993)
    Resolvability of the parameters of multiexponentials and other sum models
    IEEE Transactions on Signal Processing SP-41, p.313-322

  • A. van den Bos (1992)
    For the fun of it: A simple explanation of maximum entropy spectral analysis. Citation Classic commentary
    Current Contents, Engineering, Technology and Applied Sciences 23: (44), p.10

  • A. van den Bos (1992)
    For the fun of it: A simple explanation of maximum entropy spectral analysis. Citation Classic commentary
    Current Contents, Physical, Chemical and Earth Sciences 32: (44), p.10

  • A. van den Bos (1992)
    Ultimate resolution - A mathematical framework
    Ultramicroscopy 47, p.298-306

  • A. van den Bos, T.T. van der Werff (1990)
    Degeneracy in nonlinear least squares - Coincidence of more than two parameters
    IEE Proceedings 137: (D), p.273-280

  • A. van den Bos (1990)
    The Discrete Fourier Transform data sequence need not be circularly defined
    IEEE Transactions on Education E-38, p.368-369

  • A.J. Koster, W.J. de Ruijter, A. van den Bos, K.D. van der Mast (1989)
    Autotuning of a TEM using minimum electron dose
    Ultramicroscopy 27, p.251-272

  • A. van den Bos (1989)
    Estimation of Fourier coefficients
    IEEE Transactions on Instrumentation and Measurement IM-38, p.1005-1007

  • A. van den Bos (1988)
    Dedicated microcomputers and personal computers as experimental tools in the physics laboratory
    Periodica Technica - Electrical 32, p.5-11

  • A. van den Bos (1988)
    Least-absolute-values and minimax model fitting
    Automatica 24, p.803-808

  • A. van den Bos, P. Eykhoff (1988)
    Model building and parameter estimation as means for intelligent measurement
    Measurement 6, p.25-32

  • A.J. Koster, A. van den Bos, K.D. van der Mast (1987)
    An autofocus method for a TEM
    Ultramicroscopy 21, p.209-221

  • A. van den Bos (1987)
    A new method for synthesis of low-peak-factor signals
    IEEE Transactions on Acoustics, Speech, and Signal Processing ASSP-35, p.120-122

  • A. van den Bos (1987)
    Optical resolution: an analysis based on catastrophe theory
    Journal of the Optical Society of America A A 4, p.1402-1406

  • A. van den Bos (1985)
    Variance and bias of the normalized relay correlation estimator
    IEEE Transactions on Acoustics, Speech, and Signal Processing ASSP-33, p.334-336

  • A. van den Bos (1984)
    Physical model fitting - The choice of criterion of goodness of fit
    Measurement 2, p.98-102

  • A. van den Bos (1984)
    Resolution of model fitting methods
    International Journal of Systems Science 15, p.825-835

  • A. van den Bos (1983)
    Limits to resolution in nonlinear least squares model fitting
    IEEE transactions on automatic control AC-28, p.1118-1120

  • A. van den Bos (1981)
    Degeneracy in nonlinear least squares
    IEE Proceedings 128: (D), p.109-116

  • A. van den Bos (1980)
    A class of small sample nonlinear least squares problems
    Automatica 16, p.487-490

  • A. van den Bos, R.G. Krol (1979)
    Synthesis of discrete-interval binary signals with specified Fourier amplitude spectra
    International Journal of Control 30, p.871-884

  • A. van den Bos (1978)
    Author's reply to Comment on Application of statistical parameter estimation methods to physical measurements
    Journal of Physics E: Scientific Instruments 11, p.375

  • A. van den Bos (1977)
    Application of statistical parameter estimation methods to physical measurements
    Journal of Physics E: Scientific Instruments 10, p.753-760

  • A. van den Bos, R. Isermann, J.E. Rijnsdorp (1974)
    "Identification is coming of age ...", A report on the Third IFAC Symposium on Identification and System Parameter Estimation
    Automatica 10, p.215-222

  • A. van den Bos (1971)
    Alternative interpretation of maximum entropy spectral analysis
    IEEE Transactions on Information Theory IT-17, p.493-494

 

Contributions to books

  • A. van den Bos, A.J. den Dekker (2001)
    Resolution Reconsidered - Conventional Approaches and an Alternative
    P.W. Hawkes (ed.), Advances in Imaging and Electron Physics, Volume 117, Academic Press, San Diego, p.242-360

  • A. van den Bos (1999)
    Measurement Errors
    Wiley Encyclopedia of Electrical and Electronics Engineering, Volume 12, Edited by John G. Webster, John Wiley & Sons, Inc., New York, 1999, p.448-459

  • D. Van Dyck, E. Bettens, A.J. den Dekker, J. Jansen, M. Op de Beeck, J. Sijbers, A. van den Bos, H. Zandbergen (1997)
    Resolving atoms: what do we have?, what do we want?
    Institute of Physics Conference Series number 153, Section 3, Edited by J.M. Rodenburg, Institute of Physics Ltd, Bristol, 1997, p.95-100
    View PDF-file

  • A. van den Bos (1993)
    Periodic test signals - Properties and use
    Perturbation Signals for System Identification, Chapter 4, Edited by K.R. Godfrey, Prentice Hall, New York, 1993, p.161-175

  • A. van den Bos (1991)
    Identification of continuous-time systems using multiharmonic test signals
    Identification of Continuous-Time Systems: Methodology and Computer Implementation, Chapter 16, Edited by N.K. Sinha and G.P. Rao, Kluwer Academic Publishers, Dordrecht, 1991, p.489-508

  • A. van den Bos (1986)
    Application of statistical parameter estimation techniques to physical measurements
    Instrument Science and Technology, Volume 1, Edited by Jones, B.E., Adam Hilger, Bristol, 1986, p.28-37

  • A. van den Bos (1982)
    Parameter estimation
    Handbook of Measurement Science, Volume 1, Chapter 8, Edited by Sydenham, P.H., Wiley, Chicester, 1982, p.331-377

  • A. van den Bos (1978)
    Alternative interpretation of maximum entropy spectral analysis
    Modern Spectral Analysis, IEEE Selected Reprint Series, Edited by Childers, D.G., IEEE Press, New York, 1978, p.92-93

Last modified: 23 February 2004, 12:22 UTC
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