List of publications - Ms.drs. S. (Sandra) Van Aert

Authored or co-authored journal papers

• D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos (2003)
  Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
  Ultramicroscopy 98: (1), p.27-42
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• S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
  High-resolution electron microscopy and electron tomography: resolution versus precision
  Journal of Structural Biology, Academic Press, San Diego, 2002 138: (), p.21-33
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• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2002)
  High-Resolution Electron Microscopy: From Imaging Toward Measuring
  IEEE Transactions on Instrumentation and Measurement 51: (4), p.611-615
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• S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos (2002)
  Optimal experimental design of STEM measurement of atom column positions
  Ultramicroscopy 90: (4), p.273-289
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• A.J. den Dekker, S. Van Aert, D. Van Dyck, A. van den Bos, P. Geuens (2001)
  Does a monochromator improve the precision in quantitative HRTEM?
  Ultramicroscopy 89: (4), p.275-290
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• S. Van Aert, D. Van Dyck (2001)
  Do smaller probes in a STEM result in more precise measurement of the distances between atom columns?
  Philosophical Magazine Part B  81: (11), p.1833-1846
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• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
  High resolution electron microscopy: from imaging towards measuring
  Selected Topics in Signals, Systems and Control, Edited by O.H. Bosgra, P.M.J. Van den Hof and C.W. Scherer, Delft University Press, Delft, The Netherlands, 2001 12, p.89-96, ISBN:90-407-2246-3
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Authored or co-authored conference papers

• A.J. den Dekker, S. Van Aert (2002)
  Quantitative high resolution electron microscopy and Fisher information
  Proceedings of the 15th International Congress on Electron Microscopy, Edited by R. Cross, Microscopy Society of Southern Africa, Onderstepoort, South Africa, 2002, Durban, South Africa, 1-6 September 2002, Volume:3, p.185-186, ISBN:0-620-29294-6
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• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2002)
  The benefits of statistical experimental design for quantitative electron microscopy
  Proceedings of the 15th International Congress on Electron Microscopy, Edited by R. Cross, Microscopy Society of Southern Africa, Onderstepoort, South Africa, 2002, Durban , South Africa, 1-6 September 2002, Volume:3, p.189-190, ISBN:0-620-29294-6
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• D. Van Dyck, S. Van Aert, A.J. den Dekker, A. van den Bos (2002)
  How to select the items for the shopping list of future high resolution electron microscopists?
  Microscopy and Microanalysis 8, Suppl. 2: Proceedings Microscopy and Microanalysis 2002, Edited by E. Voelkl, D. Piston, R. Gauvin, A.J. Lockley, G.W. Bailey and S. McKernan, Cambridge University Press, Cambridge, 2002, Québec, Canada, 4-8 August 2002, Volume:8, p.94-95
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• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
  High Resolution Electron Microscopy: From Imaging Towards Measuring
  Proceedings of IMTC\2001, the Instrumentation and Measurement Technology Conference, IEEE, Piscataway, NJ, 2001, Budapest, May 21-23, 2001, Volume:3, p.2081-2086
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• A.J. den Dekker, S. Van Aert, A. van den Bos, D. Van Dyck (2000)
  A quantitative evaluation of different STEM imaging modes
  Proceedings of EUREM 12, the 12th European Congress on Electron Microscopy, Edited by L. Frank and F. Ciampor, Czechoslovak Society for Electron Microscopy, Brno, 2000, Brno, Czech Republic, July 9-14 , 2000, p.I 131-I 132
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• A.J. den Dekker, P. Geuens, S. Van Aert, A. van den Bos, D. Van Dyck (2000)
  Does a monochromator improve the precision in quantitative HRTEM?
  Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the joint Meeting of the BVM and the NVvM, Edited by H.K. Koerten, NVvM, 2000, Papendal, Arnhem, The Netherlands, December 7-8, 2000, p.138-140, ISBN:1389-5362

• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2000)
  Design aspects for an optimum DF STEM probe
  Proceedings of EUREM 12, the 12th European Congress on Electron Microscopy, Edited by L. Frank and F. Ciampor, Volume III, Instrumentation and Methodology. Edited by P. Tomanek and R. Kolarik., Czechoslovak Society for Electron Microscopy, Brno, 2000, p.I 129-I 130
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• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2000)
  Quantitative ADF STEM: guidelines towards an inmproved experimental design
  Jaarboek Nederlandse Vereniging voor Microscopie 2000, including the proceedings of the joint Meeting of the BVM and the NVvM, Edited by H.K. Koerten, NVvM, 2000, Papendal, Arnhem, The Netherlands, December 7-8, 2000, p.126-127, ISBN:1389-5362

Abstracts

• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
  Electron tomography: resolution versus precision
  Academy Colloquium Electron Tomography, The Royal Netherlands Academy of Arts and Sciences (KNAW), Amsterdam, 2001, October 17-20, 2001

• S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck (2001)
  Experiment design in quantitative electron microscopy
  Abstracts "Dreilandertagung fur Elektronenmikroskopie" - A Conference on Modern Microscopical Methods, September 9-14, 2001, p.28