Short biography of dr. ir. A.J. den Dekker

Arjan den Dekker was born in Vlaardingen, The Netherlands. He received the M.Sc. degree (cum laude) in applied physics in 1992 and the Ph.D. degree (cum laude) in 1997, both from Delft University of Technology, The Netherlands. His Ph.D. thesis entitled "Model-based resolution" reviews past and present approaches to resolution and presents an alternative model-based resolution criterion. From April 1997 to August 1998 he held a short term visiting position at the Vision Lab, University of Antwerp, Belgium. From September 1998 to June 1999 he worked as a research fellow at the Centre for Electron Microscopy and Materials Science (EMAT), University of Antwerp, Belgium. In July 1999, he was awarded with a research fellowship of the Royal Netherlands Academy of Arts and Sciences (KNAW). From July 1999 to June 2004, he held a position as KNAW research fellow at Delft University of Technology, The Netherlands. His KNAW research project was entitled "Towards quantitative structure determination through electron microscopy". Currently, he is an assistant professor at the Delft Center for Systems and Control of Delft University of Technology. His research interests include statistical signal processing and inverse problems. His research is embedded in the application domain of physical imaging systems, with special reference to electron microscopy and magnetic resonance imaging.