Short biography of dr. ir. A.J. den Dekker

Arnold J. (Arjan) den Dekker received the M.Sc. degree (cum laude) in applied physics and the Ph.D. degree (cum laude) from Delft University of Technology (DUT), Delft, The Netherlands, in 1992 and 1997, respectively. His Ph.D. thesis entitled "Model-based resolution" reviews past and present approaches to resolution and presents an alternative model-based resolution criterion. From April 1997 to August 1998 he held a short term visiting position at the Vision Lab, University of Antwerp, Belgium. From September 1998 to June 1999 he worked as a research fellow at the Centre for Electron Microscopy and Materials Science (EMAT), University of Antwerp, Belgium. In July 1999 he was awarded a prestigious talent research fellowship of the Royal Netherlands Academy of Arts and Sciences (KNAW), which funded his position as a KNAW research fellow at DUT from 1999 to 2004. His KNAW research project was entitled "Towards quantitative structure determination through electron microscopy". Currently, he holds a position as assistant professor at the Delft Center for Systems and Control of Delft University of Technology and a position as visiting professor at the University of Antwerp. His research interests include statistical signal processing and inverse problems. His research is embedded in the application domain of physical imaging systems, with special reference to magnetic resonance imaging and electron microscopy.